We are seeking a highly motivated candidate to join our team in advancing precision measurement and metrology research for emerging technologies. The successful candidate will play a key role in developing, validating, and benchmarking high‑accuracy wafer‑level mmWave calibration methodologies, working closely with fabrication and international metrology partners.
Key Responsibilities
- Conduct on‑wafer RF/mmWave measurements using VNAs, probe stations, and mmWave probes (typically up to 110 GHz, extensible to higher frequencies).
- Develop, implement, and validate advanced on‑wafer calibration techniques (e.g. TRL, LRRM, LRM, multiline TRL).
- Characterise fabricated on‑wafer calibration kits and evaluate measurement accuracy, repeatability, and uncertainty.
- Perform data analysis, error modelling, and performance benchmarking against metrology and industry practices.
- Support the establishment of measurement traceability aligned with national and international metrology standards.
- Work closely with fabrication teams to enable design–fabrication–measurement feedback loops for calibration structure optimisation.
Job Requirements
Qualification
PhD (or strong degrees with relevant experience) in Electrical Engineering, Microelectronics, Applied Physics, or related disciplines.
Other Requirements
- Hands on experience in RF/mmWave measurements, preferably including wafer level probing.
- Strong understanding of VNA calibration, de-embedding, and high frequency measurement techniques.
- Experience with data analysis tools (e.g. MATLAB, Python) is advantageous.
- Good analytical skills, and technical writing ability.
- Ability to work effectively in a multi institution, interdisciplinary research team.